Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation
A novel instrument is presented, which permits studies on singly charged free nanoparticles in the diameter range from 1 to 30 nm using synchrotron radiation in the soft x-ray regime. It consists of a high pressure nanoparticle source, a high efficiency nanoparticle beam inlet, and an electron time-...
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| Hauptverfasser: | , , , , , , |
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| Dokumenttyp: | Article (Journal) |
| Sprache: | Englisch |
| Veröffentlicht: |
26 August 2010
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| In: |
Review of scientific instruments
Year: 2010, Jahrgang: 81, Heft: 8, Pages: 1-4 |
| ISSN: | 1089-7623 |
| DOI: | 10.1063/1.3475154 |
| Online-Zugang: | Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1063/1.3475154 Verlag, lizenzpflichtig, Volltext: https://aip.scitation.org/doi/10.1063/1.3475154 
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| Verfasserangaben: | Jan Meinen, Svetlana Khasminskaya, Markus Eritt, Thomas Leisner, Egill Antonsson, Burkhard Langer, and Eckart Rühl |
MARC
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| 245 | 1 | 0 | |a Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation |c Jan Meinen, Svetlana Khasminskaya, Markus Eritt, Thomas Leisner, Egill Antonsson, Burkhard Langer, and Eckart Rühl |
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| 520 | |a A novel instrument is presented, which permits studies on singly charged free nanoparticles in the diameter range from 1 to 30 nm using synchrotron radiation in the soft x-ray regime. It consists of a high pressure nanoparticle source, a high efficiency nanoparticle beam inlet, and an electron time-of-flight spectrometer suitable for probing surface and bulk properties of free, levitated nanoparticles. We show results from x-ray photoelectron spectroscopy study near the - Si - L - 3,2 - Si L3,2 - -edge on 8.2 nm - SiO - 2 - SiO2 - particles prepared in a nanoparticle beam. The possible use of this apparatus regarding chemical reactions on the surface of nanometer-sized particles is highlighted. This approach has the potential to be exploited for process studies on heterogeneous atmospheric chemistry. | ||
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