Object wave reconstruction by phase-plate transmission electron microscopy

A method is described for the reconstruction of the amplitude and phase of the object exit wave function by phase-plate transmission electron microscopy. The proposed method can be considered as in-line holography and requires three images, taken with different phase shifts between undiffracted and...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Gamm, Björn (VerfasserIn) , Dries, Manuel Rainer (VerfasserIn) , Schultheiß, Katrin (VerfasserIn) , Blank, H. (VerfasserIn) , Rosenauer, Andreas (VerfasserIn) , Schröder, Rasmus R. (VerfasserIn) , Gerthsen, Dagmar (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 12 February 2010
In: Ultramicroscopy
Year: 2010, Jahrgang: 110, Heft: 7, Pages: 807-814
ISSN:1879-2723
DOI:10.1016/j.ultramic.2010.02.006
Online-Zugang:Verlag, lizenzpflichtig, Volltext: https://doi.org/10.1016/j.ultramic.2010.02.006
Verlag, lizenzpflichtig, Volltext: https://www.sciencedirect.com/science/article/pii/S0304399110000331
Volltext
Verfasserangaben:B. Gamm, M. Dries, K. Schultheiss, H. Blank, A. Rosenauer, R.R. Schröder, D. Gerthsen
Beschreibung
Zusammenfassung:A method is described for the reconstruction of the amplitude and phase of the object exit wave function by phase-plate transmission electron microscopy. The proposed method can be considered as in-line holography and requires three images, taken with different phase shifts between undiffracted and diffracted electrons induced by a suitable phase-shifting device. The proposed method is applicable for arbitrary object exit wave functions and non-linear image formation. Verification of the method is performed for examples of a simulated crystalline object wave function and a wave function acquired with off-axis holography. The impact of noise on the reconstruction of the wave function is investigated.
Beschreibung:Gesehen am 25.07.2023
Beschreibung:Online Resource
ISSN:1879-2723
DOI:10.1016/j.ultramic.2010.02.006