Aglieri Rinella, G., Andronic, A., Antonelli, M., Aresti, M., Baccomi, R., Becht, P., . . . Villani, A. (2023). Digital pixel test structures implemented in a 65 nm CMOS process. Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1056, . https://doi.org/10.1016/j.nima.2023.168589
Chicago Style (17th ed.) CitationAglieri Rinella, Gianluca, et al. "Digital Pixel Test Structures Implemented in a 65 Nm CMOS Process." Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment 1056 (2023). https://doi.org/10.1016/j.nima.2023.168589.
MLA (9th ed.) CitationAglieri Rinella, Gianluca, et al. "Digital Pixel Test Structures Implemented in a 65 Nm CMOS Process." Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 1056, 2023, https://doi.org/10.1016/j.nima.2023.168589.