Kieseler, J., Almeida, P. G. D. d., Kałuzińska, O. A., Mühlnikel, M. C., Diehl, L., Sicking, E., & Zehetner, P. (2023). Isothermal annealing of radiation defects in silicon bulk material of diodes from 8” silicon wafers. Journal of Instrumentation, 18(09), . https://doi.org/10.1088/1748-0221/18/09/P09010
Chicago-Zitierstil (17. Ausg.)Kieseler, Jan, Pedro Gonçalo Dias de Almeida, Oliwia Agnieszka Kałuzińska, Marie Christin Mühlnikel, Leena Diehl, Eva Sicking, und Philipp Zehetner. "Isothermal Annealing of Radiation Defects in Silicon Bulk Material of Diodes from 8” Silicon Wafers." Journal of Instrumentation 18, no. 09 (2023). https://doi.org/10.1088/1748-0221/18/09/P09010.
MLA-Zitierstil (9. Ausg.)Kieseler, Jan, et al. "Isothermal Annealing of Radiation Defects in Silicon Bulk Material of Diodes from 8” Silicon Wafers." Journal of Instrumentation, vol. 18, no. 09, 2023, https://doi.org/10.1088/1748-0221/18/09/P09010.