Kang, T. Y., Lee, H., & Suh, S. (2024). An empirical study on fault detection and root cause analysis of indium tin oxide electrodes by processing S-parameter patterns. IEEE transactions on device and materials reliability, 24(3), . https://doi.org/10.1109/TDMR.2024.3415049
Chicago-Zitierstil (17. Ausg.)Kang, Tae Yeob, Haebom Lee, und Sungho Suh. "An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-parameter Patterns." IEEE Transactions on Device and Materials Reliability 24, no. 3 (2024). https://doi.org/10.1109/TDMR.2024.3415049.
MLA-Zitierstil (9. Ausg.)Kang, Tae Yeob, et al. "An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-parameter Patterns." IEEE Transactions on Device and Materials Reliability, vol. 24, no. 3, 2024, https://doi.org/10.1109/TDMR.2024.3415049.