Always remain suspicious: a case study on tracking down a technical artefact while measuring IR-RF
Identifying systematic errors that are introduced by the measurement equipment is a necessary prerequisite for reproducible measurements and reliable results. However, technical artefacts often remain unpublished. Here we report on a sudden change of luminescence intensity observed while measuring I...
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| Main Authors: | , , , , |
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| Format: | Article (Journal) |
| Language: | English |
| Published: |
2017-06-15
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| In: |
Ancient TL
Year: 2017, Volume: 35, Issue: 1, Pages: 20-30 |
| ISSN: | 0735-1348 |
| DOI: | 10.26034/la.atl.2017.510 |
| Online Access: | Verlag, kostenfrei, Volltext: https://doi.org/10.26034/la.atl.2017.510 Verlag, kostenfrei, Volltext: https://www.ancienttl.org/article/view/6774 |
| Author Notes: | Sebastian Kreutzer, Madhav Krishna Murari, Marine Frouin Markus Fuchs, Norbert Mercier |
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| 520 | |a Identifying systematic errors that are introduced by the measurement equipment is a necessary prerequisite for reproducible measurements and reliable results. However, technical artefacts often remain unpublished. Here we report on a sudden change of luminescence intensity observed while measuring IR-RF signals from K-feldspar extracts. The measurements were carried out on a lexsyg research reader. A lateral movement of the sample carrier up to 0.5mm relative to the photomultiplier tube and the irradiation source, causes a change in the sample geometry. This movement results in inter-aliquot scatter during the measurement of IR-RF. Two solutions are discussed to remove this effect: (I) data post-processing and (II) design change by the manufacturer. Our study so far is limited to IR-RF measurements on a single luminescence reader and suggests due caution in the identification of such systematic errors. | ||
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