Always remain suspicious: a case study on tracking down a technical artefact while measuring IR-RF

Identifying systematic errors that are introduced by the measurement equipment is a necessary prerequisite for reproducible measurements and reliable results. However, technical artefacts often remain unpublished. Here we report on a sudden change of luminescence intensity observed while measuring I...

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Main Authors: Kreutzer, Sebastian (Author) , Murari, Madhav Krishna (Author) , Frouin, Marine (Author) , Fuchs, Markus (Author) , Mercier, Norbert (Author)
Format: Article (Journal)
Language:English
Published: 2017-06-15
In: Ancient TL
Year: 2017, Volume: 35, Issue: 1, Pages: 20-30
ISSN:0735-1348
DOI:10.26034/la.atl.2017.510
Online Access:Verlag, kostenfrei, Volltext: https://doi.org/10.26034/la.atl.2017.510
Verlag, kostenfrei, Volltext: https://www.ancienttl.org/article/view/6774
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Author Notes:Sebastian Kreutzer, Madhav Krishna Murari, Marine Frouin Markus Fuchs, Norbert Mercier

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520 |a Identifying systematic errors that are introduced by the measurement equipment is a necessary prerequisite for reproducible measurements and reliable results. However, technical artefacts often remain unpublished. Here we report on a sudden change of luminescence intensity observed while measuring IR-RF signals from K-feldspar extracts. The measurements were carried out on a lexsyg research reader. A lateral movement of the sample carrier up to 0.5mm relative to the photomultiplier tube and the irradiation source, causes a change in the sample geometry. This movement results in inter-aliquot scatter during the measurement of IR-RF. Two solutions are discussed to remove this effect: (I) data post-processing and (II) design change by the manufacturer. Our study so far is limited to IR-RF measurements on a single luminescence reader and suggests due caution in the identification of such systematic errors. 
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