Zhu, C., Zhu, G., Zhao, Y., Yi, R., Hou, X., & Qin, J. (2024). Capacitance measurement for evaluating the initial top-electrode-damage-induced degradation of organic devices. ACS materials letters, 6(9), . https://doi.org/10.1021/acsmaterialslett.4c01103
Chicago Style (17th ed.) CitationZhu, Chunqin, Guangrui Zhu, Ya Zhao, Ruichen Yi, Xiaoyuan Hou, and Jiajun Qin. "Capacitance Measurement for Evaluating the Initial Top-electrode-damage-induced Degradation of Organic Devices." ACS Materials Letters 6, no. 9 (2024). https://doi.org/10.1021/acsmaterialslett.4c01103.
MLA (9th ed.) CitationZhu, Chunqin, et al. "Capacitance Measurement for Evaluating the Initial Top-electrode-damage-induced Degradation of Organic Devices." ACS Materials Letters, vol. 6, no. 9, 2024, https://doi.org/10.1021/acsmaterialslett.4c01103.