APA (7th ed.) Citation

Szydłowska, B. M., Hartwig, O., Tywoniuk, B., Hartman, T., Stimpel-Lindner, T., Sofer, Z., . . . Backes, C. (2020). Spectroscopic thickness and quality metrics for PtSe2 layers produced by top-down and bottom-up techniques. 2D Materials, 7(4), . https://doi.org/10.1088/2053-1583/aba9a0

Chicago Style (17th ed.) Citation

Szydłowska, Beata Maria, Oliver Hartwig, Bartlomiej Tywoniuk, Tomáš Hartman, Tanja Stimpel-Lindner, Zdeněk Sofer, Niall McEvoy, Georg S. Duesberg, and Claudia Backes. "Spectroscopic Thickness and Quality Metrics for PtSe2 Layers Produced by Top-down and Bottom-up Techniques." 2D Materials 7, no. 4 (2020). https://doi.org/10.1088/2053-1583/aba9a0.

MLA (9th ed.) Citation

Szydłowska, Beata Maria, et al. "Spectroscopic Thickness and Quality Metrics for PtSe2 Layers Produced by Top-down and Bottom-up Techniques." 2D Materials, vol. 7, no. 4, 2020, https://doi.org/10.1088/2053-1583/aba9a0.