Spectroscopic thickness and quality metrics for PtSe2 layers produced by top-down and bottom-up techniques - Szydłowska, Beata Maria; Hartwig, Oliver; Tywoniuk, Bartlomiej; Hartman, Tomáš; Stimpel-Lindner, Tanja; Sofer, Zdeněk; McEvoy, Niall; Duesberg, Georg S; Backes, Claudia (2D Materials, 2020)
Online publiziert: 17 September 2020