Kałuzińska, O. A., Diehl, L., Sicking, E., Mühlnikel, M. C., de Almeida, P. G. D., Kieseler, J., . . . Defranchis, M. M. (2025). Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafers. Journal of Instrumentation, 20(06), . https://doi.org/10.1088/1748-0221/20/06/P06054
Chicago-Zitierstil (17. Ausg.)Kałuzińska, Oliwia Agnieszka, Leena Diehl, Eva Sicking, Marie Christin Mühlnikel, Pedro Gonçalo Dias de Almeida, Jan Kieseler, Matthias Kettner, David Walter, und Matteo M. Defranchis. "Annealing Behaviour of Charge Collection of Neutron Irradiated Diodes from 8-inch P-type Silicon Wafers." Journal of Instrumentation 20, no. 06 (2025). https://doi.org/10.1088/1748-0221/20/06/P06054.
MLA-Zitierstil (9. Ausg.)Kałuzińska, Oliwia Agnieszka, et al. "Annealing Behaviour of Charge Collection of Neutron Irradiated Diodes from 8-inch P-type Silicon Wafers." Journal of Instrumentation, vol. 20, no. 06, 2025, https://doi.org/10.1088/1748-0221/20/06/P06054.