Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafers

To face the higher levels of radiation due to the 10-fold increase in integrated luminosity during the High-Luminosity LHC, the CMS detector will replace the current Calorimeter Endcap (CE) using the High-Granularity Calorimeter (HGCAL) concept. The electromagnetic section as well as the high-radiat...

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Main Authors: Kałuzińska, Oliwia Agnieszka (Author) , Diehl, Leena (Author) , Sicking, Eva (Author) , Mühlnikel, Marie Christin (Author) , de Almeida, Pedro Gonçalo Dias (Author) , Kieseler, Jan (Author) , Kettner, Matthias (Author) , Walter, David (Author) , Defranchis, Matteo M. (Author)
Format: Article (Journal)
Language:English
Published: 27 June 2025
In: Journal of Instrumentation
Year: 2025, Volume: 20, Issue: 06, Pages: 1-20
ISSN:1748-0221
DOI:10.1088/1748-0221/20/06/P06054
Online Access:Verlag, kostenfrei, Volltext: https://doi.org/10.1088/1748-0221/20/06/P06054
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Author Notes:Oliwia Agnieszka Kałuzińska, Leena Diehl, Eva Sicking, Marie Christin Mühlnikel, Pedro Gonçalo Dias de Almeida, Jan Kieseler, Matthias Kettner, David Walter and Matteo M. Defranchis

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LEADER 00000naa a2200000 c 4500
001 1946042625
003 DE-627
005 20251215105927.0
007 cr uuu---uuuuu
008 251215s2025 xx |||||o 00| ||eng c
024 7 |a 10.1088/1748-0221/20/06/P06054  |2 doi 
035 |a (DE-627)1946042625 
035 |a (DE-599)KXP1946042625 
040 |a DE-627  |b ger  |c DE-627  |e rda 
041 |a eng 
084 |a 29  |2 sdnb 
100 1 |a Kałuzińska, Oliwia Agnieszka  |e VerfasserIn  |0 (DE-588)1384370730  |0 (DE-627)1946045438  |4 aut 
245 1 0 |a Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafers  |c Oliwia Agnieszka Kałuzińska, Leena Diehl, Eva Sicking, Marie Christin Mühlnikel, Pedro Gonçalo Dias de Almeida, Jan Kieseler, Matthias Kettner, David Walter and Matteo M. Defranchis 
264 1 |c 27 June 2025 
300 |b Illustrationen, Diagramme 
300 |a 20 
336 |a Text  |b txt  |2 rdacontent 
337 |a Computermedien  |b c  |2 rdamedia 
338 |a Online-Ressource  |b cr  |2 rdacarrier 
500 |a Gesehen am 15.12.2025 
520 |a To face the higher levels of radiation due to the 10-fold increase in integrated luminosity during the High-Luminosity LHC, the CMS detector will replace the current Calorimeter Endcap (CE) using the High-Granularity Calorimeter (HGCAL) concept. The electromagnetic section as well as the high-radiation regions of the hadronic section of the CE will be equipped with silicon pad sensors, covering a total area of 620 m2. Fluences up to 1.0·1016 neq/cm2 and doses up to 2 MGy are expected considering an integrated luminosity of 3 ab-1. The whole CE will normally operate at -35°C in order to mitigate the effects of radiation damage. The silicon sensors are processed on 8-inch p-type wafers with an active thickness of 300 μm, 200 μm and 120 μm and cut into hexagonal shapes for optimal use of the wafer area and tiling. With each main sensor several small sized test structures (e.g. pad diodes) are hosted on the wafers, used for quality assurance and radiation hardness tests. In order to investigate the radiation-induced bulk damage, 28 diodes have been irradiated with reactor neutrons at the TRIGA reactor in JSI (Jožef Stefan Institute, Ljubljana) to 13 fluences between 6.5·1014 neq/cm2 and 1.5·1016 neq/cm2. The charge collection of the irradiated silicon diodes was determined through transient current technique (TCT) measurements. The study focuses on the isothermal annealing behaviour of the bulk material at 60°C. The results have been used to extend the usage of thicker silicon sensors in regions expecting higher fluences and are being used to estimate the expected annealing effects of the silicon sensors during year-end technical stops and long HL-LHC shutdowns currently foreseen with a temperature around 0°C. 
700 1 |a Diehl, Leena  |e VerfasserIn  |4 aut 
700 1 |a Sicking, Eva  |e VerfasserIn  |4 aut 
700 1 |a Mühlnikel, Marie Christin  |e VerfasserIn  |0 (DE-588)1337582697  |0 (DE-627)1897334451  |4 aut 
700 1 |a de Almeida, Pedro Gonçalo Dias  |e VerfasserIn  |4 aut 
700 1 |a Kieseler, Jan  |e VerfasserIn  |4 aut 
700 1 |a Kettner, Matthias  |e VerfasserIn  |4 aut 
700 1 |a Walter, David  |e VerfasserIn  |4 aut 
700 1 |a Defranchis, Matteo M.  |e VerfasserIn  |4 aut 
773 0 8 |i Enthalten in  |t Journal of Instrumentation  |d London : Inst. of Physics, 2006  |g 20(2025), 06 vom: Juni, Artikel-ID P06054, Seite 1-20  |h Online-Ressource  |w (DE-627)512298181  |w (DE-600)2235672-1  |w (DE-576)256442541  |x 1748-0221  |7 nnas  |a Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafers 
773 1 8 |g volume:20  |g year:2025  |g number:06  |g month:06  |g elocationid:P06054  |g pages:1-20  |g extent:20  |a Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafers 
856 4 0 |u https://doi.org/10.1088/1748-0221/20/06/P06054  |x Verlag  |x Resolving-System  |z kostenfrei  |3 Volltext  |7 0 
951 |a AR 
992 |a 20251215 
993 |a Article 
994 |a 2025 
998 |g 1337582697  |a Mühlnikel, Marie Christin  |m 1337582697:Mühlnikel, Marie Christin  |d 130000  |e 130000PM1337582697  |k 0/130000/  |p 4 
999 |a KXP-PPN1946042625  |e 4828029729 
BIB |a Y 
SER |a journal 
JSO |a {"recId":"1946042625","language":["eng"],"type":{"bibl":"article-journal","media":"Online-Ressource"},"note":["Gesehen am 15.12.2025"],"person":[{"family":"Kałuzińska","given":"Oliwia Agnieszka","roleDisplay":"VerfasserIn","display":"Kałuzińska, Oliwia Agnieszka","role":"aut"},{"role":"aut","display":"Diehl, Leena","roleDisplay":"VerfasserIn","given":"Leena","family":"Diehl"},{"display":"Sicking, Eva","roleDisplay":"VerfasserIn","role":"aut","family":"Sicking","given":"Eva"},{"given":"Marie Christin","family":"Mühlnikel","role":"aut","roleDisplay":"VerfasserIn","display":"Mühlnikel, Marie Christin"},{"role":"aut","roleDisplay":"VerfasserIn","display":"de Almeida, Pedro Gonçalo Dias","given":"Pedro Gonçalo Dias","family":"de Almeida"},{"roleDisplay":"VerfasserIn","display":"Kieseler, Jan","role":"aut","family":"Kieseler","given":"Jan"},{"given":"Matthias","family":"Kettner","role":"aut","roleDisplay":"VerfasserIn","display":"Kettner, Matthias"},{"family":"Walter","given":"David","roleDisplay":"VerfasserIn","display":"Walter, David","role":"aut"},{"role":"aut","roleDisplay":"VerfasserIn","display":"Defranchis, Matteo M.","given":"Matteo M.","family":"Defranchis"}],"title":[{"title":"Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafers","title_sort":"Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafers"}],"relHost":[{"name":{"displayForm":["Institute of Physics Publishing"]},"origin":[{"dateIssuedDisp":"2006-","dateIssuedKey":"2006","publisher":"Inst. of Physics","publisherPlace":"London"}],"id":{"issn":["1748-0221"],"zdb":["2235672-1"],"eki":["512298181"]},"physDesc":[{"extent":"Online-Ressource"}],"title":[{"title":"Journal of Instrumentation","title_sort":"Journal of Instrumentation"}],"type":{"bibl":"periodical","media":"Online-Ressource"},"disp":"Annealing behaviour of charge collection of neutron irradiated diodes from 8-inch p-type silicon wafersJournal of Instrumentation","note":["Gesehen am 02.11.2020"],"recId":"512298181","language":["eng"],"pubHistory":["1.2006 -"],"part":{"extent":"20","volume":"20","text":"20(2025), 06 vom: Juni, Artikel-ID P06054, Seite 1-20","pages":"1-20","issue":"06","year":"2025"}}],"physDesc":[{"extent":"20 S.","noteIll":"Illustrationen, Diagramme"}],"name":{"displayForm":["Oliwia Agnieszka Kałuzińska, Leena Diehl, Eva Sicking, Marie Christin Mühlnikel, Pedro Gonçalo Dias de Almeida, Jan Kieseler, Matthias Kettner, David Walter and Matteo M. Defranchis"]},"id":{"doi":["10.1088/1748-0221/20/06/P06054"],"eki":["1946042625"]},"origin":[{"dateIssuedDisp":"27 June 2025","dateIssuedKey":"2025"}]} 
SRT |a KALUZINSKAANNEALINGB2720