Further characterisation of Digital Pixel Test Structures implemented in a 65 nm CMOS process - Aglieri Rinella, Gianluca; Apadula, Nicole; Andronic, Anton; Antonelli, Matias; Aresti, Mauro; Baccomi, Roberto; Becht, Pascal; Beole, Stefania; Borri, Marcello; Braach, Justus; Buckland, Matthew Daniel; Buschmann, Eric; et al. (Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2026)
Online verfügbar: 14. Oktober 2025, Artikelversion: 17. Oktober 2025