APA (7th ed.) Citation

Jessen, A., Blattgerste, C., Legnar, M., Popovic, Z. V., Porubský, S., & Weis, C. T. (2025). Efficient finetuning of foundation model combined with few-shot learning improves pattern recognition in histopathology. Virchows Archiv. https://doi.org/10.1007/s00428-025-04351-8

Chicago Style (17th ed.) Citation

Jessen, Ayk, Christoph Blattgerste, Maximilian Legnar, Zoran V. Popovic, Štefan Porubský, and Cleo-Aron Thias Weis. "Efficient Finetuning of Foundation Model Combined with Few-shot Learning Improves Pattern Recognition in Histopathology." Virchows Archiv 2025. https://doi.org/10.1007/s00428-025-04351-8.

MLA (9th ed.) Citation

Jessen, Ayk, et al. "Efficient Finetuning of Foundation Model Combined with Few-shot Learning Improves Pattern Recognition in Histopathology." Virchows Archiv, 2025, https://doi.org/10.1007/s00428-025-04351-8.