Direct measurement of the effective electronic temperature in organic semiconductors

Organic semiconductors show complex phenomena due to their high energetic disorder. A striking example is the possibility of an increased effective temperature 𝑇eff of the charge carrier distribution relative to the lattice temperature, which results from the slow charge carrier relaxation after exc...

Full description

Saved in:
Bibliographic Details
Main Authors: Kompatscher, Anton (Author) , Kemerink, Martijn (Author)
Format: Article (Journal)
Language:English
Published: 24 November, 2025
In: Physical review letters
Year: 2025, Volume: 135, Issue: 22, Pages: 1-6
ISSN:1079-7114
DOI:10.1103/rgt1-789y
Online Access:Verlag, kostenfrei, Volltext: https://doi.org/10.1103/rgt1-789y
Verlag, kostenfrei, Volltext: https://link.aps.org/doi/10.1103/rgt1-789y
Get full text
Author Notes:Anton Kompatscher and Martijn Kemerink
Description
Summary:Organic semiconductors show complex phenomena due to their high energetic disorder. A striking example is the possibility of an increased effective temperature 𝑇eff of the charge carrier distribution relative to the lattice temperature, which results from the slow charge carrier relaxation after excitation, either by high electric field or photon absorption. The increased effective temperature has been linked to conductivity enhancements and performance increases in actual devices, but a direct observation has been lacking. Here, we utilize nanoscopic tree-terminal devices to measure the Seebeck voltage arising in a doped organic polymer semiconductor due to a field-driven enhancement of the effective electronic temperature, providing direct proof of the existence of 𝑇eff. The results agree quantitatively with numerical predictions by a kinetic Monte Carlo model. The findings not only provide fundamental understanding but also indicate an avenue toward low-loss thermoelectric devices.
Item Description:Veröffentlicht: 24. November 2025
Gesehen am 23.02.2026
Physical Description:Online Resource
ISSN:1079-7114
DOI:10.1103/rgt1-789y