APA (7th ed.) Citation

Diehl, L., Kałuzińska, O. A., Mühlnikel, M. C., Andersson, M., Gerassyova, N., Amer, J., . . . Defranchis, M. (2026). Temperature dependence of the long-term annealing behavior of neutron irradiated diodes from 8-inch p-type silicon wafers. Journal of Instrumentation, 21, . https://doi.org/10.1088/1748-0221/21/03/P03034

Chicago Style (17th ed.) Citation

Diehl, Leena, et al. "Temperature Dependence of the Long-term Annealing Behavior of Neutron Irradiated Diodes from 8-inch P-type Silicon Wafers." Journal of Instrumentation 21 (2026). https://doi.org/10.1088/1748-0221/21/03/P03034.

MLA (9th ed.) Citation

Diehl, Leena, et al. "Temperature Dependence of the Long-term Annealing Behavior of Neutron Irradiated Diodes from 8-inch P-type Silicon Wafers." Journal of Instrumentation, vol. 21, 2026, https://doi.org/10.1088/1748-0221/21/03/P03034.