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X-ray optics and microanalysis: proceedings of the 20th international congress, Karlsruhe, Germany, 15 - 18 September 2009 ; [ICXOM20]

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Bibliographic Details
Corporate Author: International Congress on X-Ray Optics and Microanalysis (Other)
Other Authors: Denecke, Melissa A. (Other) , Walker, Clive T. (Other)
Format: Conference Paper
Language:English
Published: Melville, NYk American Inst. of Physics 2010
Series:AIP conference proceedings 1221
In: AIP conference proceedings (1221)

Volumes / Articles: Show Volumes / Articles.
Subjects:
Konferenzschrift
Elektronenstrahlmikroanalyse
Röntgenoptik
Online Access:Verlag, Verlagsangaben: http://www.loc.gov/catdir/enhancements/fy1202/2011499270-d.html
Verlag, Abstracts: http://aip.scitation.org/toc/apc/1221/1
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Author Notes:ed. Melissa A. Denecke ...

MARC

LEADER 00000cam a2200000 c 4500
001 630047847
003 DE-627
005 20250715120412.0
007 tu
008 100624s2010 xxu||||| 00| ||eng c
010 |a  2011499270 
020 |a 9780735407640  |9 978-0-7354-0764-0 
035 |a (DE-627)630047847 
035 |a (DE-576)324970684 
035 |a (DE-599)BSZ324970684 
035 |a (OCoLC)699714136 
035 |a (OCoLC)699714136 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
044 |c XD-US 
050 0 |a TA1775 
084 |a 31  |2 sdnb 
084 |a 35.25  |2 bkl 
084 |a 33.18  |2 bkl 
084 |a 33.61  |2 bkl 
245 0 0 |a X-ray optics and microanalysis  |b proceedings of the 20th international congress, Karlsruhe, Germany, 15 - 18 September 2009 ; [ICXOM20]  |c ed. Melissa A. Denecke ... 
264 1 |a Melville, NYk  |b American Inst. of Physics  |c 2010 
300 |a XIV, 214 S.  |b Ill., graph. Darst. 
336 |a Text  |b txt  |2 rdacontent 
337 |a ohne Hilfsmittel zu benutzen  |b n  |2 rdamedia 
338 |a Band  |b nc  |2 rdacarrier 
490 1 |a AIP conference proceedings  |v 1221 
500 |a Sponsoring organizations: Research Center Karlsruhe (FZK)-Program Nuclear  
505 8 |a Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques. 
583 1 |a Archivierung prüfen  |c 20240324  |f DE-4165  |z 1  |2 pdager 
583 1 |a Archivierung/Langzeitarchivierung gewährleistet  |c 20240722  |f NI-LastCopies  |x XA-DE-NI  |z Potenzieller Alleinbesitz Niedersachsen  |2 pdager  |5 DE-89 
650 0 |a X-ray optics  |v Congresses 
650 0 |a Materials  |x Microscopy  |v Congresses 
650 0 |a X-ray microanalysis  |v Congresses 
650 0 |a X-ray microscopes  |v Congresses 
655 7 |a Konferenzschrift  |0 (DE-588)1071861417  |0 (DE-627)826484824  |0 (DE-576)433375485  |2 gnd-content 
689 0 0 |d s  |0 (DE-588)4178318-9  |0 (DE-627)104278773  |0 (DE-576)209983604  |a Röntgenoptik  |2 gnd 
689 0 1 |d s  |0 (DE-588)4151898-6  |0 (DE-627)104339675  |0 (DE-576)209791241  |a Elektronenstrahlmikroanalyse  |2 gnd 
689 0 |5 (DE-627) 
700 1 |a Denecke, Melissa A.  |4 oth 
700 1 |a Walker, Clive T.  |4 oth 
711 2 |a International Congress on X-Ray Optics and Microanalysis  |n 20  |d 2009  |c Karlsruhe  |0 (DE-588)16077608-9  |0 (DE-627)712904212  |0 (DE-576)326137076  |4 oth 
810 2 |a American Institute of Physics  |t AIP conference proceedings  |v 1221  |9 1221  |w (DE-627)129404055  |w (DE-576)014785595  |w (DE-600)187069-5  |x 0094-243X  |7 am 
856 4 2 |u http://www.loc.gov/catdir/enhancements/fy1202/2011499270-d.html  |x Verlag  |3 Verlagsangaben 
856 4 2 |u http://aip.scitation.org/toc/apc/1221/1  |x Verlag  |y Abstracts 
935 |i Blocktest 
936 b k |a 35.25  |j Spektrochemische Analyse  |0 (DE-627)106419218 
936 b k |a 33.18  |j Optik  |0 (DE-627)106419102 
936 b k |a 33.61  |j Festkörperphysik  |0 (DE-627)106419145 
951 |a BO 
990 |a Elektronenstrahlmikroanalyse 
990 |a Röntgenoptik 
992 |a 20150929 
999 |a KXP-PPN630047847  |e 3096363633 
BIB |a Y 
SPR |a Y 
JSO |a {"id":{"eki":["630047847"],"isbn":["9780735407640"]},"origin":[{"dateIssuedDisp":"2010","dateIssuedKey":"2010","publisher":"American Inst. of Physics","publisherPlace":"Melville, NYk"}],"name":{"displayForm":["ed. Melissa A. Denecke ..."]},"relMultPart":[{"title":[{"title_sort":"AIP conference proceedings","title":"AIP conference proceedings"}],"type":{"bibl":"serial"},"disp":"AIP conference proceedings","recId":"129404055","corporate":[{"roleDisplay":"VerfasserIn","display":"American Institute of Physics","role":"aut"}],"language":["eng"],"pubHistory":["Nr. 1.1970 -"],"part":{"number_sort":["1221"],"number":["1221"]},"titleAlt":[{"title":"CONF / AIP conference proceedings"},{"title":"American Institute of Physics conference proceedings"},{"title":"Conference proceedings"},{"title":"AIP proceedings"}],"name":{"displayForm":["American Institute of Physics"]},"origin":[{"dateIssuedDisp":"1970-","dateIssuedKey":"1970","publisher":"American Inst. of Physics","publisherPlace":"Melville, NY ; New York, NY"}],"id":{"eki":["129404055"],"zdb":["187069-5"],"issn":["0094-243X"]},"physDesc":[{"noteFormat":"24 cm"}],"dispAlt":"American Institute of Physics: AIP conference proceedings"}],"physDesc":[{"noteIll":"Ill., graph. Darst.","extent":"XIV, 214 S."}],"title":[{"subtitle":"proceedings of the 20th international congress, Karlsruhe, Germany, 15 - 18 September 2009 ; [ICXOM20]","title":"X-ray optics and microanalysis","title_sort":"X-ray optics and microanalysis"}],"person":[{"given":"Melissa A.","family":"Denecke","role":"oth","display":"Denecke, Melissa A."},{"family":"Walker","given":"Clive T.","display":"Walker, Clive T.","role":"oth"}],"recId":"630047847","language":["eng"],"corporate":[{"display":"International Congress on X-Ray Optics and Microanalysis (20, 2009, Karlsruhe)","role":"oth"}],"type":{"bibl":"edited-book"},"note":["Sponsoring organizations: Research Center Karlsruhe (FZK)-Program Nuclear "]} 
SRT |a XRAYOPTICS2010 

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