X-ray optics and microanalysis: proceedings of the 20th international congress, Karlsruhe, Germany, 15 - 18 September 2009 ; [ICXOM20]
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| Corporate Author: | |
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| Other Authors: | , |
| Format: | Conference Paper |
| Language: | English |
| Published: |
Melville, NYk
American Inst. of Physics
2010
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| Series: | AIP conference proceedings
1221 |
| In: |
AIP conference proceedings (1221)
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| Volumes / Articles: | Show Volumes / Articles. |
| Subjects: | |
| Online Access: | Verlag, Verlagsangaben: http://www.loc.gov/catdir/enhancements/fy1202/2011499270-d.html Verlag, Abstracts: http://aip.scitation.org/toc/apc/1221/1 
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| Author Notes: | ed. Melissa A. Denecke ... |
Table of Contents:
- Advances in instrumentation, detection, and methodology
- X-ray optics monochromators and multilayers, focusing optics
- Quantitative and multivariate analysis
- Imaging techniques and image processing
- Applications of nano-, micro-, and surface analysis techniques.