X-ray radiation of highly charged ions: with 52 tables
X-Ray Radiation of Highly Charged Ions is a comprehensive collection of atomic characteristics of highly charged ion (HCI) sources and elementary processes related to X-ray radiation: energy levels, wavelengths, transition probabilities, cross sections, and rate coefficients. The material covers a b...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Dokumenttyp: | Book/Monograph |
| Sprache: | Englisch |
| Veröffentlicht: |
Berlin Heidelberg
Springer
1997
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| Schriftenreihe: | Springer Series on Atoms and Plasmas
19 |
| DOI: | 10.1007/978-3-662-03495-8 |
| Schlagworte: | |
| Online-Zugang: | Resolving-System, lizenzpflichtig, Volltext: http://dx.doi.org/10.1007/978-3-662-03495-8
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| Verfasserangaben: | H. F. Beyer; H.-J. Kluge; V. P. Shevelko |
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