APA (7th ed.) Citation

Titze, B. (2013). Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging. https://doi.org/10.11588/heidok.00015372

Chicago Style (17th ed.) Citation

Titze, Benjamin. Techniques to Prevent Sample Surface Charging and Reduce Beam Damage Effects for SBEM Imaging. 2013. https://doi.org/10.11588/heidok.00015372.

MLA (9th ed.) Citation

Titze, Benjamin. Techniques to Prevent Sample Surface Charging and Reduce Beam Damage Effects for SBEM Imaging. 2013. https://doi.org/10.11588/heidok.00015372.

Warning: These citations may not always be 100% accurate.