Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging
Gespeichert in:
| 1. Verfasser: | |
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| Dokumenttyp: | Buch/Monographie Hochschulschrift |
| Sprache: | Englisch |
| Veröffentlicht: |
2013
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| DOI: | 10.11588/heidok.00015372 |
| Schlagworte: | |
| Online-Zugang: | Resolving-System, kostenfrei, Volltext: http://nbn-resolving.de/urn:nbn:de:bsz:16-heidok-153721 Resolving-System, Volltext: https://nbn-resolving.org/urn:nbn:de:bsz:16-heidok-153721 Langzeitarchivierung Nationalbibliothek, Volltext: http://d-nb.info/1180031296/34 Verlag, kostenfrei, Volltext: http://www.ub.uni-heidelberg.de/archiv/15372 Resolving-System, Unbekannt: https://doi.org/10.11588/heidok.00015372 
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| Verfasserangaben: | Benjamin Titze |
MARC
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