Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging

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Bibliographic Details
Main Author:	Titze, Benjamin (Author)
Format:	Book/Monograph Thesis
Language:	English
Published:	2013
DOI:	10.11588/heidok.00015372
Subjects:	Hochschulschrift Strahlenschaden Oberflächenladung Rasterelektronenmikroskopie
Online Access:	Resolving-System, kostenfrei, Volltext: http://nbn-resolving.de/urn:nbn:de:bsz:16-heidok-153721 Resolving-System, Volltext: https://nbn-resolving.org/urn:nbn:de:bsz:16-heidok-153721 Langzeitarchivierung Nationalbibliothek, Volltext: http://d-nb.info/1180031296/34 Verlag, kostenfrei, Volltext: http://www.ub.uni-heidelberg.de/archiv/15372 Resolving-System, Unbekannt: https://doi.org/10.11588/heidok.00015372
Author Notes:	Benjamin Titze

Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging by Titze, Benjamin (Author)

2013

Inhaltsverzeichnis

Book/Monograph Thesis