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IR ellipsometry
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Mid-infrared optical and electrical properties of indium tin oxide films
by Tamanai, Akemi (Author)
, Sendner, Michael (Author)
, Pucci, Annemarie (Author)
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Physica status solidi. A, Applications and materials science, 214 (2017,3) Artikel-Nummer 1600467, 8 Seiten
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Mid-infrared characterization of thiophene-based thin polymer films
by Tamanai, Akemi (Author)
, Beck, Sebastian (Author)
, Pucci, Annemarie (Author)
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Displays, 34 (2013), 5, Seite 399-405
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The Faculty of Physics and Astronomy
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Kirchhoff Institute for Physics
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Pucci, Annemarie
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Tamanai, Akemi
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Beck, Sebastian
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Sendner, Michael
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IR ellipsometry
Absorption
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Dielectric function
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IR spectroscopy
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Thiophene-based polymer
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dielectric functions
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indium tin oxide
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sputtering
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