Newest Titles

• Further characterisation of Digital Pixel Test Structures implemented in a 65 nm CMOS process
  Article (Journal), Online Resource
• Detection efficiency and spatial resolution of Monolithic Active Pixel Sensors bent to different radii
  Article (Journal), Online Resource
• A compact front-end circuit for a monolithic sensor in a 65-nm CMOS imaging technology
  Article (Journal), Online Resource
• Digital pixel test structures implemented in a 65 nm CMOS process
  Article (Journal), Online Resource
• First demonstration of in-beam performance of bent Monolithic Active Pixel Sensors
  Article (Journal), Online Resource

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Related Authors

• Masciocchi, Silvia
• Aglieri Rinella, Gianluca
• Carnesecchi, Francesca
• Contin, Giacomo
• Hillemanns, Hartmut

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