Dauerhafte URL dieser Seite: https://heibib.ub.uni-heidelberg.de/person/1290223017
Becht, Pascal (M.Sc.)
Newest Titles
- Further characterisation of Digital Pixel Test Structures implemented in a 65 nm CMOS processArticle (Journal), Online Resource
- Detection efficiency and spatial resolution of Monolithic Active Pixel Sensors bent to different radiiArticle (Journal), Online Resource
- A compact front-end circuit for a monolithic sensor in a 65-nm CMOS imaging technologyArticle (Journal), Online Resource
- Digital pixel test structures implemented in a 65 nm CMOS processArticle (Journal), Online Resource
- First demonstration of in-beam performance of bent Monolithic Active Pixel SensorsArticle (Journal), Online Resource



