Pattern recognition / 29 Heidelberg, Germany, September 12 - 14, 2007; Proceedings / Fred A. Hamprecht, Christoph Schnörr, Bernd Jähne (eds.)

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Bibliographic Details
Corporate Author:	Symposium Mustererkennung (Other)
Other Authors:	Hamprecht, Fred (Editor) , Jähne, Bernd (Editor) , Schnörr, Christoph (Editor)
Format:	Conference Paper
Language:	English
Published:	Berlin Heidelberg [u.a.] Springer 2007
Series:	Lecture notes in computer science 4713
In:	Pattern recognition
Subjects:	Konferenzschrift
Online Access:	Cover: https://swbplus.bsz-bw.de/bsz27183482xcov.jpg Verlag, Zentralblatt MATH, Inhaltstext: https://zbmath.org/?q=an:1145.68303
Author Notes:	DAGM Symposium

Description
ISBN:	3540749330 9783540749332

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