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Pattern recognition / 29 Heidelberg, Germany, September 12 - 14, 2007; Proceedings / Fred A. Hamprecht, Christoph Schnörr, Bernd Jähne (eds.)

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Bibliographic Details
Corporate Author: Symposium Mustererkennung (Other)
Other Authors: Hamprecht, Fred (Editor) , Jähne, Bernd (Editor) , Schnörr, Christoph (Editor)
Format: Conference Paper
Language:English
Published: Berlin Heidelberg [u.a.] Springer 2007
Series:Lecture notes in computer science 4713
In: Pattern recognition

Subjects:
Konferenzschrift
Online Access:Cover: https://swbplus.bsz-bw.de/bsz27183482xcov.jpg
Verlag, Zentralblatt MATH, Inhaltstext: https://zbmath.org/?q=an:1145.68303
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Author Notes:DAGM Symposium

MARC

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