Precision measurements with SMI and 4Pi microscopy

Saved in:

Bibliographic Details
Main Author:	Baddeley, David (Author)
Format:	Book/Monograph Thesis
Language:	English
Published:	2007
Subjects:	Hochschulschrift Vier-Pi-Mikroskopie
Online Access:
Author Notes:	presneted by David Baddeley

Description
Item Description:	Zsfassung in dt. Sprache

Similar Items