Prunici, P. (2007). Characterization of ultrathin films on silicon by scanning force microscopy, FTIR-spectroscopy and ellipsometry.
Chicago-Zitierstil (17. Ausg.)Prunici, Pavel. Characterization of Ultrathin Films on Silicon by Scanning Force Microscopy, FTIR-spectroscopy and Ellipsometry. 2007.
MLA-Zitierstil (9. Ausg.)Prunici, Pavel. Characterization of Ultrathin Films on Silicon by Scanning Force Microscopy, FTIR-spectroscopy and Ellipsometry. 2007.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.