Vapor pressure and evaporation coefficient measurements at elevated temperatures with a Knudsen cell and a quartz crystal microbalance: new data for SiO

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Bibliographic Details
Main Authors: Wetzel, Steffen (Author) , Pucci, Annemarie (Author) , Gail, Hans-Peter (Author)
Format: Article (Journal)
Language:English
Published: 2012
In: Journal of chemical & engineering data
Year: 2012, Volume: 57, Issue: 5, Pages: 1594-1601
ISSN:1520-5134
DOI:110.1021/je300199a
Online Access:Resolving-System, Volltext: http://dx.doi.org/110.1021/je300199a
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Author Notes:Steffen Wetzel; Annemarie Pucci; Hans-Peter Gail
Description
Physical Description:Online Resource
ISSN:1520-5134
DOI:110.1021/je300199a