Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging

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Bibliographic Details
Main Author: Titze, Benjamin (Author)
Format: Book/Monograph Thesis
Language:English
Published: 2013
Subjects:
Online Access:Inhaltsverzeichnis: http://d-nb.info/1041654715/04
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Author Notes:put forward by Bnjamin Titze
Description
Item Description:Zsfassung in dt. Sprache