Titze, B. (2013). Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging.
Chicago Style (17th ed.) CitationTitze, Benjamin. Techniques to Prevent Sample Surface Charging and Reduce Beam Damage Effects for SBEM Imaging. 2013.
MLA (9th ed.) CitationTitze, Benjamin. Techniques to Prevent Sample Surface Charging and Reduce Beam Damage Effects for SBEM Imaging. 2013.
Warning: These citations may not always be 100% accurate.