|
|
|
|
| LEADER |
00000cam a2200000 c 4500 |
| 001 |
1464473404 |
| 003 |
DE-627 |
| 005 |
20240826163329.0 |
| 007 |
tu |
| 008 |
131018s2013 xx ||||| m 00| ||eng c |
| 035 |
|
|
|a (DE-627)1464473404
|
| 035 |
|
|
|a (DE-576)39447340X
|
| 035 |
|
|
|a (DE-599)BSZ39447340X
|
| 035 |
|
|
|a (OCoLC)862982983
|
| 040 |
|
|
|a DE-627
|b ger
|c DE-627
|e rakwb
|
| 041 |
|
|
|a eng
|
| 082 |
0 |
|
|a 530
|a 600
|q SEPA
|
| 082 |
0 |
|
|a 502.825
|q SEPA
|
| 082 |
0 |
|
|a 530.417
|q SEPA
|
| 084 |
|
|
|a 29
|2 sdnb
|
| 084 |
|
|
|a 29
|2 sdnb
|
| 084 |
|
|
|a 35
|2 sdnb
|
| 100 |
1 |
|
|a Titze, Benjamin
|0 (DE-588)1041654642
|0 (DE-627)767228871
|0 (DE-576)393349748
|4 aut
|
| 245 |
1 |
0 |
|a Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging
|c put forward by Bnjamin Titze
|
| 264 |
|
1 |
|c 2013
|
| 300 |
|
|
|a 112 S.
|b Ill., graph. Darst.
|
| 336 |
|
|
|a Text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
|
| 338 |
|
|
|a Band
|b nc
|2 rdacarrier
|
| 500 |
|
|
|a Zsfassung in dt. Sprache
|
| 502 |
|
|
|a Heidelberg, Univ., Diss., 2013
|
| 583 |
1 |
|
|a Archivierung/Langzeitarchivierung gewährleistet
|f DISS
|x XA-DE-BW
|2 pdager
|5 DE-16
|
| 655 |
|
7 |
|a Hochschulschrift
|0 (DE-588)4113937-9
|0 (DE-627)105825778
|0 (DE-576)209480580
|2 gnd-content
|
| 689 |
0 |
0 |
|d s
|0 (DE-588)4048455-5
|0 (DE-627)106190644
|0 (DE-576)209077956
|a Rasterelektronenmikroskopie
|2 gnd
|
| 689 |
0 |
1 |
|d s
|0 (DE-588)4172248-6
|0 (DE-627)105388580
|0 (DE-576)209942169
|a Oberflächenladung
|2 gnd
|
| 689 |
0 |
2 |
|d s
|0 (DE-588)4057825-2
|0 (DE-627)106149377
|0 (DE-576)209123834
|a Strahlenschaden
|2 gnd
|
| 689 |
0 |
|
|5 (DE-627)
|
| 751 |
|
|
|a Heidelberg
|0 (DE-588)4023996-2
|0 (DE-627)106300814
|0 (DE-576)208952578
|4 uvp
|
| 776 |
0 |
8 |
|i Erscheint auch als
|n Online-Ausgabe
|a Titze, Benjamin
|t Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging
|d 2013
|h Online-Ressource
|w (DE-627)796784981
|w (DE-576)414165497
|
| 856 |
4 |
2 |
|u http://d-nb.info/1041654715/04
|m B:DE-101
|q application/pdf
|3 Inhaltsverzeichnis
|
| 951 |
|
|
|a BO
|
| 990 |
|
|
|a Strahlenschaden
|
| 990 |
|
|
|a Oberflächenladung
|
| 990 |
|
|
|a Rasterelektronenmikroskopie
|
| 992 |
|
|
|a 20201229
|
| 993 |
|
|
|a Thesis
|
| 998 |
|
|
|g 1041654642
|a Titze, Benjamin
|m 1041654642:Titze, Benjamin
|d 130000
|d 130001
|e 130000PT1041654642
|e 130001PT1041654642
|k 0/130000/
|k 1/130000/130001/
|p 1
|x j
|y j
|
| 999 |
|
|
|a KXP-PPN1464473404
|e 3828666884
|
| BIB |
|
|
|a Y
|
| JSO |
|
|
|a {"type":{"bibl":"thesis"},"note":["Zsfassung in dt. Sprache"],"recId":"1464473404","language":["eng"],"person":[{"role":"aut","display":"Titze, Benjamin","given":"Benjamin","family":"Titze"}],"noteThesis":["Heidelberg, Univ., Diss., 2013"],"title":[{"title_sort":"Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging","title":"Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging"}],"physDesc":[{"extent":"112 S.","noteIll":"Ill., graph. Darst."}],"name":{"displayForm":["put forward by Bnjamin Titze"]},"origin":[{"dateIssuedDisp":"2013","dateIssuedKey":"2013"}],"id":{"eki":["1464473404"]}}
|
| SRT |
|
|
|a TITZEBENJATECHNIQUES2013
|
