Random projection for dimensionality reduction: Applied to time-of-flight secondary ion mass spectrometry data

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Bibliographic Details
Other Authors: Varmuza, Kurt (Other) , Trieloff, Mario (Other)
Format: Article (Journal)
Language:English
Published: 2011
In: Analytica chimica acta
Year: 2011, Volume: 705, Issue: 1-2, Pages: 48-55
ISSN:1873-4324
Online Access:Verlag, Volltext: http://www.sciencedirect.com/science/article/pii/S0003267011004053
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Author Notes:Varmuza, K. ... Trieloff, M.
Description
Item Description:Gesehen am 28.01.2015
Physical Description:Online Resource
ISSN:1873-4324