A study of enhanced ion formation from metal-semiconductor complexes in atmospheric pressure laser desorption/ionization mass spectrometry
The study of the key parameters impacted surface-assisted laser desorption/ionization-mass spectrometry is of broad interest. In previous studies, it has been shown that surface-assisted laser desorption/ionization-mass spectrometry is a complex process depending on multiple factors. In the presente...
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| Main Authors: | , , |
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| Corporate Author: | |
| Format: | Article (Journal) |
| Language: | English |
| Published: |
2017
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| In: |
Journal of mass spectrometry
Year: 2016, Volume: 52, Issue: 1, Pages: 43-53 |
| ISSN: | 1096-9888 |
| DOI: | 10.1002/jms.3898 |
| Online Access: | Verlag, Volltext: http://dx.doi.org/10.1002/jms.3898 Verlag, Volltext: http://onlinelibrary.wiley.com/doi/10.1002/jms.3898/abstract 
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| Author Notes: | Yuliya E. Silina, Petra Herbeck-Engel and Marcus Koch |
| Summary: | The study of the key parameters impacted surface-assisted laser desorption/ionization-mass spectrometry is of broad interest. In previous studies, it has been shown that surface-assisted laser desorption/ionization-mass spectrometry is a complex process depending on multiple factors. In the presented study, we showed that neither porosity, light absorbance nor surface hydrophobicity alone influence the enhancement phenomena observed from the hybrid metal-semiconductor complexes versus individual targets, but small changes in the analyte attaching to the target significantly affect laser desorption ionization-efficiency. By means of Raman spectroscopy and scanning electron microscopy, it was revealed that the formation of an amorphous analyte layer after drying on a solid substrate was essential for the enhanced laser desorption ionization-signal observed from the hybrid metal-semiconductor targets, and the crystallization properties of the analyte appeared as a function of the substrate. Obtained results were used for the screening of regular and lactose-free milk samples through the hybrid metal-semiconductor target. Copyright © 2016 John Wiley & Sons, Ltd. |
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| Item Description: | Published online: 16 November 2016 Gesehen am 24.07.2017 |
| Physical Description: | Online Resource |
| ISSN: | 1096-9888 |
| DOI: | 10.1002/jms.3898 |