Characterization, operation and wafer-level testing of an ultra-fast 4k pixel readout ASIC for the DSSC x-ray detector at the European XFEL
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| Main Author: | |
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| Format: | Book/Monograph Thesis |
| Language: | English |
| Published: |
Heidelberg
2018
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| Author Notes: | put forward by Dipl.-Phys. Jan Soldat ; referees: Prof. Dr. Peter Fischer [und ein weiterer Gutachter] |
| Description not available. |