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|a Characterization, operation and wafer-level testing of an ultra-fast 4k pixel readout ASIC for the DSSC x-ray detector at the European XFEL
|c put forward by Dipl.-Phys. Jan Soldat ; referees: Prof. Dr. Peter Fischer [und ein weiterer Gutachter]
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|c 2018
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|b Dissertation
|c Ruperto-Carola University of Heidelberg
|d 2018
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|n Online-Ausgabe
|a Soldat, Jan, 1986 -
|t Characterization, operation and wafer-level testing of an ultra-fast 4k pixel readout ASIC for the DSSC x-ray detector at the European XFEL
|d Heidelberg, 2018
|h 1 Online-Ressource (159 Seiten)
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