The effect of PECVD SiNx moisture barrier layers on the degradation of a flip chip underfill material

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Bibliographische Detailangaben
Hauptverfasser: Kaltenpoth, Gisela (VerfasserIn) , Siebert, Walter (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 2001
In: Soldering & surface mount technology
Year: 2001, Jahrgang: 13, Heft: 3, Pages: 12-15
ISSN:1758-6836
DOI:10.1108/EUM0000000006024
Online-Zugang:Verlag, kostenfrei registrierungspflichtig, Volltext: https://doi.org/10.1108/EUM0000000006024
Volltext
Verfasserangaben:G. Kaltenpoth, W. Siebert, X-M. Xie, F. Stubhan

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