Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-Ångström emitter localization
Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
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| Main Authors: | , |
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| Format: | Article (Journal) |
| Language: | English |
| Published: |
November 20, 2012
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| In: |
Advanced materials
Year: 2012, Volume: 24, Issue: 44, Pages: OP309-OP313 |
| ISSN: | 1521-4095 |
| DOI: | 10.1002/adma.201203033 |
| Online Access: | Verlag, kostenfrei, Volltext: http://dx.doi.org/10.1002/adma.201203033 Verlag, kostenfrei, Volltext: https://onlinelibrary.wiley.com/doi/abs/10.1002/adma.201203033 
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| Author Notes: | Dominik Wildanger, Brian R. Patton, Heiko Schill, Luca Marseglia, J.P. Hadden, Sebastian Knauer, Andreas Schönle, John G. Rarity, Jeremy L. O'Brien, Stefan W. Hell, and Jason M. Smith |
| Summary: | Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm. |
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| Item Description: | Gesehen am 05.11.2018 |
| Physical Description: | Online Resource |
| ISSN: | 1521-4095 |
| DOI: | 10.1002/adma.201203033 |