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Scanning tunneling microscopy/spectroscopy and related techniques: 12th International Conference, STM'03; Eindhoven, Netherlands, 21-25 July 2003

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Bibliographic Details
Corporate Authors: Technische Universiteit Eindhoven (Other) , STM (Other)
Other Authors: Koenraad, Paulus M. (Editor) , Kemerink, Martijn (Editor)
Format: Conference Paper
Language:English
Published: Melville, NY American Institute of Physics 2003
Series:AIP conference proceedings 696
In: AIP conference proceedings (696)

Subjects:
Konferenzschrift
CD-ROM
Tunnelspektroskopie
Rastertunnelmikroskopie
Online Access:Verlag, Abstracts: http://aip.scitation.org/toc/apc/696/1
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Author Notes:eds. P. M. Koenraad, M. Kemerink
Description
Item Description:Includes bibliographical references and index
Physical Description:CD/DVD/Blu-ray
Format:Systemvoraussetzungen: Windows 95, 98, NT, XP, and 2000 platform; Macintosh platform; UNIX platform.
ISBN:0735401683
9780735401686

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