Precision measurements with SMI and 4PiMicroscopy

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Bibliographic Details
Main Author: Baddeley, David (Author)
Format: Book/Monograph Thesis
Language:English
Published: 2007
Subjects:
Online Access:Resolving-System, kostenfrei, Volltext: http://nbn-resolving.de/urn:nbn:de:bsz:16-opus-79603
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Author Notes:David Baddeley
Description
Item Description:Online publiziert: 2008
Physical Description:Online Resource