Artifact correction and real-time scatter estimation for X-ray computed tomography in industrial metrology
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| Main Author: | |
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| Format: | Book/Monograph Thesis |
| Language: | English |
| Published: |
Heidelberg
[2019?]
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| Subjects: | |
| Online Access: |
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| Author Notes: | put forward by M.Sc. Joscha Maier ; referees: Prof. Dr. Peter Bachert, Prof. Dr. Marc Kachelrieß |
| Description not available. |