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Study of the morphology of organic ferroelectric diodes with combined scanning force and scanning transmission X-ray microscopy

Organic ferroelectric diodes attract increasing interest as they combine non-destructive data read-out and low cost fabrication, two requirements in the development of novel non-volatile memory elements. The macroscopic electrical characteristics and performances of such devices strongly depend on t...

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Bibliographic Details
Main Authors: Bernard, Laetitia (Author) , Khikhlovskyi, Vsevolod (Author) , Breemen, Albert J. J. M. van (Author) , Michels, Jasper J. (Author) , Janssen, René A. J. (Author) , Kemerink, Martijn (Author) , Gelinck, Gerwin (Author) , Pilet, Nicolas (Author)
Format: Article (Journal)
Language:English
Published: 2018
In: Organic electronics
Year: 2017, Volume: 53, Pages: 242-248
DOI:10.1016/j.orgel.2017.11.012
Online Access:Verlag, Volltext: https://doi.org/10.1016/j.orgel.2017.11.012
Verlag, Volltext: http://www.sciencedirect.com/science/article/pii/S156611991730544X
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Author Notes:L. Bernard, V. Khikhlovskyi, A. van Breemen, J.J. Michels, R. Janssen, M. Kemerink, G. Gelinck, N. Pilet
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Summary:Organic ferroelectric diodes attract increasing interest as they combine non-destructive data read-out and low cost fabrication, two requirements in the development of novel non-volatile memory elements. The macroscopic electrical characteristics and performances of such devices strongly depend on their structural properties. Various studies of their global microscopic morphology have already been reported. Here, a multi-technique approach including different scanning force and X-ray microscopies permitted to reveal and locally study nanometer-scale unexpected sub-structures within a P(VDF-TrFE):F8BT ferroelectric diode. The strong impact of these structures on the local polarizability of the ferroelectric is shown. Two alternative fabrication methods are proposed that prevent the formation of these structures and demonstrate improved macroscopic device performances such as endurance and ON/OFF ratio.
Item Description:Available online: 5 December 2017
Gesehen am 27.11.2019
Physical Description:Online Resource
DOI:10.1016/j.orgel.2017.11.012

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