The operational mechanism of ferroelectric-driven organic resistive switches

The availability of a reliable memory element is crucial for the fabrication of ‘plastic’ logic circuits. We use numerical simulations to show that the switching mechanism of ferroelectric-driven organic resistive switches is the stray field of the polarized ferroelectric phase. The stray field modu...

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Bibliographic Details
Main Authors: Kemerink, Martijn (Author) , Asadi, Kamal (Author) , Blom, P. W. M. (Author) , Leeuw, Dago M. de (Author)
Format: Article (Journal)
Language:English
Published: 2012
In: Organic electronics
Year: 2011, Volume: 13, Issue: 1, Pages: 147-152
DOI:10.1016/j.orgel.2011.10.013
Online Access:Verlag, Volltext: https://doi.org/10.1016/j.orgel.2011.10.013
Verlag, Volltext: http://www.sciencedirect.com/science/article/pii/S1566119911003569
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Author Notes:Martijn Kemerink, Kamal Asadi, Paul W. M. Blom, Dago M. de Leeuw
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Summary:The availability of a reliable memory element is crucial for the fabrication of ‘plastic’ logic circuits. We use numerical simulations to show that the switching mechanism of ferroelectric-driven organic resistive switches is the stray field of the polarized ferroelectric phase. The stray field modulates the charge injection from a metallic electrode into the organic semiconductor, switching the diode from injection limited to space charge limited. The modeling rationalizes the previously observed exponential dependence of the on/off ratio on injection barrier height. We find a lower limit of about 50nm for the feature size that can be used in a crossbar array, translating into a rewritable memory with an information density of the order of 1Gb/cm2.
Item Description:Available online 7 November 2011
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Physical Description:Online Resource
DOI:10.1016/j.orgel.2011.10.013