The operational mechanism of ferroelectric-driven organic resistive switches

The availability of a reliable memory element is crucial for the fabrication of ‘plastic’ logic circuits. We use numerical simulations to show that the switching mechanism of ferroelectric-driven organic resistive switches is the stray field of the polarized ferroelectric phase. The stray field modu...

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Hauptverfasser: Kemerink, Martijn (VerfasserIn) , Asadi, Kamal (VerfasserIn) , Blom, P. W. M. (VerfasserIn) , Leeuw, Dago M. de (VerfasserIn)
Dokumenttyp: Article (Journal)
Sprache:Englisch
Veröffentlicht: 2012
In: Organic electronics
Year: 2011, Jahrgang: 13, Heft: 1, Pages: 147-152
DOI:10.1016/j.orgel.2011.10.013
Online-Zugang:Verlag, Volltext: https://doi.org/10.1016/j.orgel.2011.10.013
Verlag, Volltext: http://www.sciencedirect.com/science/article/pii/S1566119911003569
Volltext
Verfasserangaben:Martijn Kemerink, Kamal Asadi, Paul W. M. Blom, Dago M. de Leeuw

MARC

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520 |a The availability of a reliable memory element is crucial for the fabrication of ‘plastic’ logic circuits. We use numerical simulations to show that the switching mechanism of ferroelectric-driven organic resistive switches is the stray field of the polarized ferroelectric phase. The stray field modulates the charge injection from a metallic electrode into the organic semiconductor, switching the diode from injection limited to space charge limited. The modeling rationalizes the previously observed exponential dependence of the on/off ratio on injection barrier height. We find a lower limit of about 50nm for the feature size that can be used in a crossbar array, translating into a rewritable memory with an information density of the order of 1Gb/cm2. 
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