Mathijssen, S. G. J., Cölle, M., Mank, A. J. G., Kemerink, M., Bobbert, P. A., & Leeuw, D. M. d. (2007). Scanning Kelvin probe microscopy on organic field-effect transistors during gate bias stress. Applied physics letters, 90(19), . https://doi.org/10.1063/1.2737419
Chicago-Zitierstil (17. Ausg.)Mathijssen, Simon G. J., Michael Cölle, A. J. G. Mank, Martijn Kemerink, Peter A. Bobbert, und Dago M. de Leeuw. "Scanning Kelvin Probe Microscopy on Organic Field-effect Transistors During Gate Bias Stress." Applied Physics Letters 90, no. 19 (2007). https://doi.org/10.1063/1.2737419.
MLA-Zitierstil (9. Ausg.)Mathijssen, Simon G. J., et al. "Scanning Kelvin Probe Microscopy on Organic Field-effect Transistors During Gate Bias Stress." Applied Physics Letters, vol. 90, no. 19, 2007, https://doi.org/10.1063/1.2737419.