APA (7th ed.) Citation

Mathijssen, S. G. J., Cölle, M., Mank, A. J. G., Kemerink, M., Bobbert, P. A., & Leeuw, D. M. d. (2007). Scanning Kelvin probe microscopy on organic field-effect transistors during gate bias stress. Applied physics letters, 90(19), . https://doi.org/10.1063/1.2737419

Chicago Style (17th ed.) Citation

Mathijssen, Simon G. J., Michael Cölle, A. J. G. Mank, Martijn Kemerink, Peter A. Bobbert, and Dago M. de Leeuw. "Scanning Kelvin Probe Microscopy on Organic Field-effect Transistors During Gate Bias Stress." Applied Physics Letters 90, no. 19 (2007). https://doi.org/10.1063/1.2737419.

MLA (9th ed.) Citation

Mathijssen, Simon G. J., et al. "Scanning Kelvin Probe Microscopy on Organic Field-effect Transistors During Gate Bias Stress." Applied Physics Letters, vol. 90, no. 19, 2007, https://doi.org/10.1063/1.2737419.