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Measuring the potential distribution inside soft organic semiconductors with a scanning-tunneling microscope

For the first time, we directly measured the potential distribution inside organic semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning-tunneling microscope. The results are analyzed with a model that treats both current injec...

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Bibliographic Details
Main Authors: Kemerink, Martijn (Author) , Offermans, Peter (Author) , Koenraad, Paulus M. (Author) , Duren, Jeroen Karolus Johannes van (Author) , Janssen, René A. J. (Author) , Salemink, Huub W. (Author) , Wolter, Joachim H. (Author)
Format: Article (Journal)
Language:English
Published: 29 January 2002
In: Physica. E, Low-dimensional systems & nanostructures
Year: 2002, Volume: 13, Issue: 2, Pages: 1247-1250
ISSN:1386-9477
DOI:10.1016/S1386-9477(02)00346-6
Online Access:Verlag, Volltext: https://doi.org/10.1016/S1386-9477(02)00346-6
Verlag, Volltext: http://www.sciencedirect.com/science/article/pii/S1386947702003466
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Author Notes:M. Kemerink, P. Offermans, P.M. Koenraad, J.K.J. van Duren, R.A.J. Janssen, H.W.M. Salemink, J.H. Wolter
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Summary:For the first time, we directly measured the potential distribution inside organic semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning-tunneling microscope. The results are analyzed with a model that treats both current injection and bulk transport in detail. It is found that tip height-bias curves, which are taken by following the height of the STM tip as a function of bias, while the STM feedback system is active, reflect the potential distribution between tip and sample electrode.
Item Description:Gesehen am 16.12.2019
Physical Description:Online Resource
ISSN:1386-9477
DOI:10.1016/S1386-9477(02)00346-6

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