Measuring the potential distribution inside soft organic semiconductors with a scanning-tunneling microscope
For the first time, we directly measured the potential distribution inside organic semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning-tunneling microscope. The results are analyzed with a model that treats both current injec...
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| Hauptverfasser: | , , , , , , |
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| Dokumenttyp: | Article (Journal) |
| Sprache: | Englisch |
| Veröffentlicht: |
29 January 2002
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| In: |
Physica. E, Low-dimensional systems & nanostructures
Year: 2002, Jahrgang: 13, Heft: 2, Pages: 1247-1250 |
| ISSN: | 1386-9477 |
| DOI: | 10.1016/S1386-9477(02)00346-6 |
| Online-Zugang: | Verlag, Volltext: https://doi.org/10.1016/S1386-9477(02)00346-6 Verlag, Volltext: http://www.sciencedirect.com/science/article/pii/S1386947702003466 
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| Verfasserangaben: | M. Kemerink, P. Offermans, P.M. Koenraad, J.K.J. van Duren, R.A.J. Janssen, H.W.M. Salemink, J.H. Wolter |
MARC
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| 520 | |a For the first time, we directly measured the potential distribution inside organic semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning-tunneling microscope. The results are analyzed with a model that treats both current injection and bulk transport in detail. It is found that tip height-bias curves, which are taken by following the height of the STM tip as a function of bias, while the STM feedback system is active, reflect the potential distribution between tip and sample electrode. | ||
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