General rule for the energy of water-induced traps in organic semiconductors
Hole and electron traps related to the presence of trace water are found in organic semiconductor thin films, at an energy offset of ~0.3-0.4 eV from the highest occupied and lowest unoccupied molecular orbitals, respectively.
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| Main Authors: | , , , |
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| Format: | Article (Journal) |
| Language: | English |
| Published: |
22 April 2019
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| In: |
Nature materials
Year: 2019, Volume: 18, Issue: 6, Pages: 588-593 |
| ISSN: | 1476-4660 |
| DOI: | 10.1038/s41563-019-0347-y |
| Online Access: | Verlag, Volltext: https://doi.org/10.1038/s41563-019-0347-y Verlag, Volltext: https://www.nature.com/articles/s41563-019-0347-y 
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| Author Notes: | Guangzheng Zuo, Mathieu Linares, Tanvi Upreti and Martijn Kemerink |
| Summary: | Hole and electron traps related to the presence of trace water are found in organic semiconductor thin films, at an energy offset of ~0.3-0.4 eV from the highest occupied and lowest unoccupied molecular orbitals, respectively. |
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| Item Description: | Gesehen am 18.12.2019 |
| Physical Description: | Online Resource |
| ISSN: | 1476-4660 |
| DOI: | 10.1038/s41563-019-0347-y |