Electron spectroscopic study of nanoplasma formation triggered by intense soft x-ray pulses

Using electron spectroscopy, we investigated the nanoplasma formation process generated in xenon clusters by intense soft x-ray free electron laser (FEL) pulses. We found clear FEL intensity dependence of electron spectra. Multistep ionization and subsequent ionization frustration features are evide...

Full description

Saved in:
Bibliographic Details
Main Authors: Niozu, Akinobu (Author) , Gokhberg, Kirill (Author) , Kuleff, Alexander I. (Author) , Cederbaum, Lorenz S. (Author)
Format: Article (Journal)
Language:English
Published: 14 November 2019
In: The journal of chemical physics
Year: 2019, Volume: 151, Issue: 18
ISSN:1089-7690
DOI:10.1063/1.5115053
Online Access:Verlag, Volltext: https://doi.org/10.1063/1.5115053
Verlag, Volltext: https://aip.scitation.org/doi/10.1063/1.5115053
Get full text
Author Notes:Akinobu Niozu, Naomichi Yokono, Toshiyuki Nishiyama, Hironobu Fukuzawa, Tomohiro Sakurazawa, Kazuhiro Matsuda, Tsukasa Takanashi, Daehyun You, Yiwen Li, Taishi Ono, Thomas Gaumnitz, Markus Schöffler, Sven Grundmann, Shin-ichi Wada, Paolo Carpeggiani, Wei Qing Xu, Xiao Jing Liu, Shigeki Owada, Kensuke Tono, Tadashi Togashi, Makina Yabashi, Nikolai V. Kryzhevoi, Kirill Gokhberg, Alexander I. Kuleff, Lorenz S. Cederbaum, Kiyoshi Ueda, and Kiyonobu Nagaya
Description
Summary:Using electron spectroscopy, we investigated the nanoplasma formation process generated in xenon clusters by intense soft x-ray free electron laser (FEL) pulses. We found clear FEL intensity dependence of electron spectra. Multistep ionization and subsequent ionization frustration features are evident for the low FEL-intensity region, and the thermal electron emission emerges at the high FEL intensity. The present FEL intensity dependence of the electron spectra is well addressed by the frustration parameter introduced by Arbeiter and Fennel [New J. Phys. 13, 053022 (2011)].
Item Description:Gesehen am 13.02.2020
Physical Description:Online Resource
ISSN:1089-7690
DOI:10.1063/1.5115053