Milotti, V., Pietsch, M., Strunk, K., & Melzer, C. (2018). Measuring the lateral charge-carrier mobility in metal-insulator-semiconductor capacitors via Kelvin-probe. Review of scientific instruments, 89(1), . https://doi.org/10.1063/1.5002629
Chicago-Zitierstil (17. Ausg.)Milotti, Valeria, Manuel Pietsch, Karl-Philipp Strunk, und Christian Melzer. "Measuring the Lateral Charge-carrier Mobility in Metal-insulator-semiconductor Capacitors via Kelvin-probe." Review of Scientific Instruments 89, no. 1 (2018). https://doi.org/10.1063/1.5002629.
MLA-Zitierstil (9. Ausg.)Milotti, Valeria, et al. "Measuring the Lateral Charge-carrier Mobility in Metal-insulator-semiconductor Capacitors via Kelvin-probe." Review of Scientific Instruments, vol. 89, no. 1, 2018, https://doi.org/10.1063/1.5002629.